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Abstract
Recent mobile devices are highly populated with ICs together with various mobile antennas in a small form factor. Hence, noise from ICs are easily coupled to nearby antennas resulting in radio receiver sensitivity degradation, so called RF desensitization. This talk will discuss radiation and coupling mechanism, modeling approaches, measurement techniques, etc., for RF desensitization that may help understand radiation and coupling physics in a systematic way and achieve the design goal. In addition, case studies conducted on practical products will be introduced in detail to demonstrate challenges and progress.
 
Speaker biography
Chulsoon Hwang received his Ph. D. at Korea Advanced Institute of Science and Technology (KAIST) in 2012 and worked in Global Technology Center, Samsung Electronics as a senior engineer from 2012 to 2015. He is now with EMC Lab. at Missouri University of Science and Technology (Formerly University of Missouri−Rolla) as an assistant professor. He has authored or co-authored over 50 journal and conference papers. His research interests focus on the development of reliable and fast high-speed digital systems including signal/power integrity and electromagnetic interference. He is a TPC member of IEEE EMC symposium and IEEE EDAPS, and a secretary of Special Committee 5 (Power Electronics), IEEE EMC Society.